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Denmark – Scanning electron microscopes – The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source

Denmark · TED (Tenders Electronic Daily)

Buyer
Danmarks Tekniske Universitet - DTU
Country
Denmark
Published
2026-10-15
Deadline
2026-11-16
Type
cn-standard
Status
Open to bid
Category
CPV 38511100
View original notice

Description

DTU requires the supply, delivery, installation, commissioning and acceptance of one (1) focused ion beam scanning electron microscope (FIB-SEM) dual-beam platform. The instrument shall serve a multi-user research environment and will be used for high-resolution surface imaging, site-specific cross-sectioning, TEM lamella preparation (including automated workflows), 3D FIB-SEM tomography, gas-assisted deposition and etching, nanoscale manipulation, and elemental microanalysis by energy-dispersive X-ray spectroscopy (EDS) and ToF-SIMS.

The buyer's description as published on TED (Tenders Electronic Daily). The full notice is at the source.

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About this record

This notice was published via TED (Tenders Electronic Daily) and indexed automatically. Figures and dates are reproduced as published at source; always confirm against the original before acting on a deadline.

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