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Germany – Machines and apparatus for testing and measuring – Semi-Automatic Wafer Prober System for Characterization of 200-mm Wafers

Germany · TED (Tenders Electronic Daily)

Buyer
IHP GmbH - Lebniz-Institut für innovative Mikroelektronik
Country
Germany
Published
2026-09-29
Deadline
2026-10-29
Type
cn-standard
Status
Open to bid
Category
CPV 38540000
View original notice

Description

The subject of the procurement is the supply, installation and commissioning of a semi-automatic wafer prober system for the electrical and high-frequency characterization of 200-mm wafers for research and laboratory use at IHP. The system shall include, among other components, a 200-mm wafer prober with vacuum chuck and precision positioning, individual probes, multi-contact probes for RF measurements up to at least 6 GHz, a probe card system, automated microscopy and camera equipment, as well as control and software components. The scope of supply also includes transport, installation, commissioning, training, documentation, warranty and spare-parts supply.

The buyer's description as published on TED (Tenders Electronic Daily). The full notice is at the source.

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About this record

This notice was published via TED (Tenders Electronic Daily) and indexed automatically. Figures and dates are reproduced as published at source; always confirm against the original before acting on a deadline.

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